Csetverikov, Dmitrij (2000) Structural defects: general approach and application to textile inspection. In: 15th international conference on pattern recognition. ICPR-2000. Proceedings. Barcelona, 2000. Vol. 1. Computer vision and image analysis..

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Item Type:	Conference or Workshop Item (Paper)
Subjects:	Q Science > QA Mathematics and Computer Science > QA75 Electronic computers. Computer science / számítástechnika, számítógéptudomány
Divisions:	Geometric Modelling and Computer Vision Laboratory
Depositing User:	Eszter Nagy
Date Deposited:	11 Dec 2012 15:06
Last Modified:	11 Dec 2012 15:06
URI:	https://eprints.sztaki.hu/id/eprint/2315

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