A survey on novel applications of Deep Metric Learning
Kertész, Gábor and Farkas, Attila (2025) A survey on novel applications of Deep Metric Learning. In: 2025 IEEE 29th International Conference on Intelligent Engineering Systems (INES). Institute of Electrical and Electronics Engineers (IEEE), Piscataway (NJ), pp. 371-376. ISBN 9798331597726; 9798331597719 10.1109/INES67149.2025.11078206
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Kertesz_371_36193518_z.pdf Restricted to Registered users only Request a copy |
Official URL: https://doi.org/10.1109/INES67149.2025.11078206
| Item Type: | Book Section |
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| Subjects: | Q Science > QA Mathematics and Computer Science > QA75 Electronic computers. Computer science / számítástechnika, számítógéptudomány |
| Divisions: | Laboratory of Parallel and Distributed Systems |
| SWORD Depositor: | MTMT Injector |
| Depositing User: | MTMT Injector |
| Date Deposited: | 13 Jan 2026 07:33 |
| Last Modified: | 13 Jan 2026 07:33 |
| URI: | https://eprints.sztaki.hu/id/eprint/11037 |
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