Characterization of silicon field effect transistor sub-THz detectors for imaging systems

Földesy, Péter (2012) Characterization of silicon field effect transistor sub-THz detectors for imaging systems. In: 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, 20-23 May, 2012, 2012-05-20 - 2012-05-23, Szöul, Dél-Korea. 10.1109/ISCAS.2012.6272198

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Item Type: Conference or Workshop Item (-)
Additional Information: #Könyv Szerző ismeretlen
Subjects: Q Science > QA Mathematics and Computer Science > QA75 Electronic computers. Computer science / számítástechnika, számítógéptudomány
Divisions: Cellular Sensory and Optical Wave Computing Laboratory
Depositing User: EPrints Admin
Date Deposited: 16 Jan 2014 10:30
Last Modified: 05 Feb 2014 12:27
URI: http://eprints.sztaki.hu/id/eprint/7347

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