Structural defects: general approach and application to textile inspection

Csetverikov, Dmitrij (2000) Structural defects: general approach and application to textile inspection. In: 15th international conference on pattern recognition. ICPR-2000. Proceedings. Barcelona, 2000. Vol. 1. Computer vision and image analysis..

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Item Type: Conference or Workshop Item (Paper)
Subjects: Q Science > QA Mathematics and Computer Science > QA75 Electronic computers. Computer science / számítástechnika, számítógéptudomány
Divisions: Geometric Modelling and Computer Vision Laboratory
Depositing User: Eszter Nagy
Date Deposited: 11 Dec 2012 15:06
Last Modified: 11 Dec 2012 15:06
URI: http://eprints.sztaki.hu/id/eprint/2315

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