Statistical subpixel-measurement technology of light-beam width and profiles

Szirányi, Tamás (1992) Statistical subpixel-measurement technology of light-beam width and profiles. OPTICS AND LASERS IN ENGINEERING, 16. pp. 1-15.

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Item Type: Article
Subjects: Q Science > QA Mathematics and Computer Science > QA75 Electronic computers. Computer science / számítástechnika, számítógéptudomány
Divisions: Distributed Events Analysis Research Laboratory
Depositing User: Eszter Nagy
Date Deposited: 11 Dec 2012 12:37
Last Modified: 11 Dec 2012 12:37
URI: http://eprints.sztaki.hu/id/eprint/182

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